Near-field Raman spectroscopy using a sharp metal tip.

نویسندگان

  • A Hartschuh
  • N Anderson
  • L Novotny
چکیده

Near-field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning a sharp metal tip over the sample surface. The method is used to image vibrational modes of single-walled carbon nanotubes. By combining optical and topographical signals rendered by the single-walled carbon nanotubes, we can separate near-field and far-field contributions and quantify the observed Raman enhancement factors.

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عنوان ژورنال:
  • Journal of microscopy

دوره 210 Pt 3  شماره 

صفحات  -

تاریخ انتشار 2003